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Jenoptik presents new microscope camera at Control 2015 5/14/2015
At the leading trade fair for quality assurance due to take place in Stuttgart on May 5-8, Jenoptik will be exhibiting the first model from its new generation of cameras - the PROGRES GRYPHAX® SUBRA. ...
Yokogawa Releases TDLS8000 Tunable Diode Laser Spectrometer 4/29/2015
Improved reliability and operability for reduced OPEX and enhanced plant safety ...
TECHSPEC® Acylinder Lenses Focus Light in a Single Dimension 9/15/2014
Diffraction-limited focusing performance ...
3D confocal microscope µsurf custom is nominated for MEDTEC Award 2/22/2012
NanoFocus AG, developer and manufacturer of optical 3D surface measurement systems and software for the characterization of technical surfaces, presents its nanometer accurate inspection solutions for medical technology at MedTec Europe (Hall 4 / Boo...
X-Rite To Demonstrate Advanced Colour Measurement Technologies for Plastics Manufacturers at Interplas 2011 7/19/2011
Taking place at the National Exhibition Centre, Birmingham from 27th to 29th September, the Interplas 2011 show will see X-Rite Europe GmbH presenting advanced colour measurement and control technology that can be integrated into the everyday workflo...

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SPIE Sensors + Imaging 2025
9/15/2025 - 9/18/2025
Madrid, Spain
LASER World of PHOTONICS INDIA 2025
9/17/2025 - 9/19/2025
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9/17/2025 - 9/20/2025
Las Vegas NV, United States
SPIE Photomask Technology + EUV Lithography 2025
9/21/2025 - 9/25/2025
Monterey CA, United States
IOFT 2025
10/1/2025 - 10/3/2025
Tokyo, Japan
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