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Metrology & Inspection JWS-7555S Wafer Inspection
Metrology & Inspection > JWS-7555S Wafer Inspection
Manufacturer:Jeol
Condition:Used,we sell it at AS IS(Refurbished and Installation are optional)
Price:Best Offer
Amount: 1 set
Wafer Inspection SEM.

Cassette to robot handling.

Magnification to 200,000.

Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees.
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